Antonello Tamburrino, degree in electronic engineering from the Università di Napoli Federico II (Italy) and Ph.D. degree in electronic engineering at Politecnico di Torino), from 2014 to 2018 was a Full Professor of Electrical
Engineering at the College of Engineering, Michigan State University (USA). Since 2006, he has been a Full Professor of Electrical Engineering at the Department of Electrical and Information Engineering, Università di Cassino e del Lazio Meridionale (Cassino, Italy). He has authored or coauthored more than 250 papers appeared in refereed international
journals, books, and proceedings of international conferences, and he is a co-editor of three proceedings. His current research interests include inverse problems, electromagnetic imaging, nondestructive evaluation, computational electromagnetism, plasmonics, and homogenization methods. Tamburrino is currently an Editor-in-Chief of the scientific journal International Journal on Applied Electromagnetics and Mechanics, a Subject Editor of the scientific journal NDT and E International, an Associate Editor of the scientific journal Non-destructive Testing and Evaluation, and the Chair of the scientific committee of the Italian Association for Non-destructive Testing, Monitoring, Diagnostic.